| 1. | The secondary mirror must be adapted during the process of grinding and polishing to this other form .
副镜在磨制和抛光过程中必须与此新形状相适应。 |
| 2. | A secondary mirror site may have restrictions on what they mirror ( due to space restrictions )
一个从站可能对他们所镜像的内容有所限制（原应是空间限制） 。 |
| 3. | Step 2 : here you adjust the tilt of the secondary mirror to aim the focuser ' s axis at the center of the primary
现在你已经调整了副镜的倾斜程度，把调焦座的中轴已经对准了主镜。 |
| 4. | This mirror is either the secondary mirror or another , smaller one interposed between the secondary and the detectors
这个修正镜可用次镜，或是置于次镜与侦测器之间的更小镜子。 |
| 5. | We fabricated a large computer - generated holography on a concave lens surface to test the convex secondary mirrors surface
在凹透镜表面上制作出了用于凸非球面检测的曲面全息图。 |
| 6. | Computers will then cancel out much of the atmospheric blurring by making 1 , 000 subtle adjustments to the shape of each secondary mirror every second
电脑每秒钟会对反射镜的形状进行1000次的微调，以消除绝大部份的大气干扰。 |
| 7. | The roughness of wyko and afm measuring are 0 . 73nm and 0 . 56nm in rms value respectively , in both primary and secondary mirrors , and will severity reduce the schwarzschlid optics throughput and the contrast of the image
73urn ） sm ， wyko检测结果）波纹度和高频段的0 56urn （ ms ， afm捡测结果将严重影响schwarzschild微缩投影物镜的成像对比度和传输效率。 |
| 8. | The refractive / diffractive hybrid optical system is more simple , light , and compact . there are many applications for use in the measurement of convex secondary mirrors , ultraviolet spectroscopic instruments , armament , and space optical system
含有曲面衍射光学元件的光学系统结构更加简化，重量更轻，体积更小，因此在航天成像系统、军事领域、光学表面检测、光谱分析等领域具有重要的应用价值。 |
| 9. | In this paper , we mainly discuss multilayer mirrors for x - ray solar telescope operating at 17 . 1nm wavelength . the diameter of primary mirror for telescope is 130 millimeters and secondary mirror is 66mm . especially , we will engage in controllation of uniformity of period thickness
本文主要针对工作波长为17 . 1nm的x射线空间望远镜中的主镜与次镜的膜厚分布均匀性进行控制，其中主镜直径为130mm ，曲率半径为7 . 5m 。 |
| 10. | Therefore , in principle the scattering may be predicted from measurements of the surface profile . in this paper the author also discussed nonspecular scattering for mo / si multlayer coated primary and secondary mirrors of the measured schwarzschlid optics based on power spectral density of these mirrors measured by both optical profilometer ( wyko ) and atomic force microscopy ( afm )
因此，我们可以通过检测多层膜反射镜基底的粗糙度来表征多层膜反射镜非镜面散射对光学系统性能的影响，亦即通过检测多层膜反射镜基底的粗糙度调整抛光工艺参数，获得低散射的多层膜反射镜。 |
